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LPSR
300
The Laboratory
Portable SpectroReflectometer (LPSR) is
a unique integrating sphere instrument for
easily and quickly measuring total hemispherical
spectral reflectance of almost any surface.
The instrument makes measurements from 250-2800nm.
The LPSR incorporates unique optical, mechanical,
and electronic designs to provide state-of-the-art
performance in a compact portable instrument.
The LPSR has been designed for use both
in the field for measuring the extended
surfaces of operational or development hardware
and for use in the laboratory on test specimens
of varying sizes. The LSPR measures solar absorbance in accordance with ASTM E903. The LSPR 300 is also available in a vacuum chamber compatible version; LSPR 300V.
The LPSR 300 Windows XP graphical user
interface provides one button operation
for standard measurement scans or selectable
options for measurements. The automatic
operation provides user selectable starting
and ending wavelength band and step size
within the instrument range. The measurements
plot displays spectral reflectance values
vs. wavelength. Automatic integration of
the reflectance data is performed to calculate
and display solar absorptance. A manual
operation mode provides for user selectable
lamp, detector, wavelength, slit width,
and gain.
The internal hard drive provides ample
storage for thousands of full measurement
scans which is extremely useful for field
measurements as well as convenience in the
laboratory environment. An integrated optical
database manager with presentation quality
graphics package allows easy manipulation
and comparisons of stored measurements.
The LPSR 300 is a standalone system requiring
no additional hardware. Interface ports
are provided for an external monitor and
keyboard.
The table below lists specifications for the LPSR 300.
| Wavelength |
250 to 2800 nm |
| Monochromatic Type |
Prism, with selectable wavelength and slit width |
| Repeatability |
-250 to 2500 nm- ± 1%
-2500 to 2800 nm-
± 2 % |
| Sample sizes |
0.5 inches in diameter or larger |
| Measurement type |
Spectral Total Hemispherical Reflectance |
| Spectral resolution with automatic slit control |
-250 to 2500 nm - better than 5% of wavelength
-2500 to 2800 nm - better than 8% of
wavelength |
| Full scan measurement time |
Less than 2 minutes |
| Power required |
115 VAC/60 Hz |
Dimensions |
-Measurement Head: 10 x 12 x 8 inches
-PC/Power Box: 9 x 16 x 20 inches
-Instrument Head Carrying Case: 10 x
11.5 x 16 inches |
| Weight |
-Measurement Head: 15 Pounds
-PC/Power Box: 35 Pounds |
| Warranty |
1 year parts and labor |
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