Internal View of AZ's LPSR 300 V
   
  Capabilities
  Materials and Coatings
Instruments
Measurement Services
Engineering Services
Spaceflight Systems
Information Technology
 
 

Optical Properties Measurement Instruments

 

AZ Technology's unique line of highly accurate portable and laboratory portable instruments for measuring the optical properties of materials; specifically, solar absorption, emittance, reflectance, and transmittance are summarized below with links to more detailed information. AZ Technology also has the expertise and experience to custom develop related instruments. Many of these instruments were developed with NASA as described in the most recent 2009 NASA Spinoff Report.

   
       
Optical Properties Measurement Instruments:
- LPSR 300:

Laboratory Portable SpectroReflectometer (LPSR) is a unique integrating sphere instrument for easily and quickly measuring total hemispherical spectral reflectance from 250 to 2800 nm (most surfaces). This laboratory portable spectral reflectometer measures solar absorptance in accordance with ASTM E903. Also available in a vacuum chamber compatible version, LPSR 300V.

- TEMP 2000A:

Portable emissometer/reflectometer that measures total hemispherical reflectance, <3 to >35 micrometers wavelength. Provides both normal and hemispherical 300k (ambient) emittance measurements. The recognized replacement for the no longer produced Gier Dunkle DB 100 IR Reflectometer, with improved performance and maintainability and in accordance with the ASTM E408 standard

TESA 2000 Portable Reflectometer/Emissometer and Solar Absorption/Reflectometer in use
- TESA 2000: Portable emissometer/reflectometer combined with a solar reflectometer measures total hemispherical reflectance, <3 to >35 micrometers. Provides both normal and hemispherical 300k (ambient) emittance measurements. Improved performance and maintainability over the no longer produced Gier Dunkle DB 100 IR Reflectometer and in accordance with the ASTM E408 standard, and performs optically integrated total hemispheric reflectance measurement, 250 nm to 2500 nm (compact, light-weight, rugged for ease of field or lab use).
- LPIR FT: Laboratory Portable Infrared Reflectometer (LPIR) measures spectral IR total hemispherical reflectance, 2.5 to 25 microns (most surfaces). Integration of reflectance is used to calculate and display emittance. Also available in a vacuum chamber compatible version, LPIR FT V.
LPIR FT Laboratory Portable FTIR Spectroreflectometer
   

Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably.

 

Corporate :: Products & Services :: Careers :: Contact :: Home
Materials & Coatings :: Instruments :: Measurement Services :: Engineering Ser. :: Spaceflight Syst. :: Information Technology
Copyright 2004, AZ Technology Corporation. All Rights Reserved.