The Laboratory Portable SpectroReflectometer (LPSR) is a unique integrating sphere instrument for easily and quickly measuring total hemispherical spectral reflectance of almost any surface. This spectral reflectometer makes measurements from 250-2800nm. The LPSR incorporates unique optical, mechanical, and electronic designs to provide state-of-the-art performance in a compact portable instrument. The LPSR 300 has been designed for use both in the field for measuring the extended surfaces of operational or development hardware and for use in the laboratory on test specimens of varying sizes. This laboratory portable spectral reflectometer measures solar absorptance in accordance with ASTM E903. The LSPR 300 is also available in a vacuum chamber compatible version; LSPR 300V.
The LPSR 300 Windows graphical user interface provides one button operation for standard measurement scans or selectable options for measurements. The automatic operation provides user selectable starting and ending wavelength band and step size within the instrument range. The measurements plot displays spectral reflectance values vs. wavelength. Automatic integration of the reflectance data is performed to calculate and display solar absorptance. A manual operation mode provides for user selectable lamp, detector, wavelength, slit width, and gain.
The internal hard drive provides ample storage for thousands of full measurement scans which is extremely useful for field measurements as well as convenience in the laboratory environment. An integrated optical database manager with presentation quality graphics package allows easy manipulation and comparisons of stored measurements.
The LPSR 300 Laboratory Portable Spectroreflectometer is a stand-alone system requiring no additional hardware. Interface ports are provided for an external monitor and keyboard.
The table below lists specifications for the LPSR 300.
|Wavelength||250 to 2800 nm|
|Monochromatic Type||Prism, with selectable wavelength and slit width|
|Repeatability||-250 to 2500 nm- ± 1%|
-2500 to 2800 nm- ± 2 %
|Sample sizes||0.5 inches in diameter or larger|
|Measurement type||Spectral Total Hemispherical Reflectance|
|Spectral resolution with automatic slit control||-250 to 2500 nm – better than 5% of wavelength|
-2500 to 2800 nm – better than 8% of wavelength
|Full scan measurement time||Less than 2 minutes|
|Power required||115 VAC/60 Hz|
|Dimensions||-Measurement Head: 10 x 12 x 8 inches|
-PC/Power Box: 9 x 16 x 20 inches
-Instrument Head Carrying Case: 10 x 11.5 x 16 inches
|Warranty||1 year parts and labor|
*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably. Spectroreflectometer, spectro-reflectometer and spectral reflectometer are also used interchangeably.