TEMP 2000A, Portable Emissometer/Reflectometer

AZ Technology’s TEMP 2000A handheld emissometer/reflectometer is the recognized replacement for an aging Gier-Dunkle DB100 as suggested on page 23 of the following 2005 NASA Technical Paper,

“The simplest method of determining emittance is with a portable infrared reflectometer such as the [Gier Dunkle] DB100 or the AzTek [AZ Technology] Temp 2000.

— Kauder, L. (2005) NASA/TP-2005-212792, pg. 23.

Temp 2000A Portable Reflectometer/Emmisometer in lab setting with sample puck on top of unit
Temp 2000A Portable Reflectometer/Emmisometer in lab setting with sample puck on top of unit

The AZ Technology TEMP 2000A Portable Emissometer/Reflectometer is compact, lightweight, rugged, and ergonomically engineered for ease of use in the field or in the laboratory to determine ambient temperature total emittance.

The TEMP 2000A can be conveniently used in a laboratory setting (top right image) where samples can be sat atop the instrument and left while repeated measurements are being taken. The TEMP 2000A can be used as a portable unit (bottom right image) via use of a battery pack and vest.

The TEMP 2000A, by virtue of an advanced optical system, provides a portable emissometer/reflectometer that performs total hemispheric reflectance measurements from less than 3 to greater than 35 micrometers wavelength and is not limited in wavelength range due to filters, windows, or coatings, placed in the optical path. The TEMP 2000A optical system has been designed to minimize losses, to facilitate and maintain optical alignment, and to utilize the features of AZ Technology’s patented ellipsoid collector that allows compactness for portability, efficiency, and measurement accuracy. The TEMP 2000A provides improved performance and maintainability over the no longer produced Gier Dunkle DB-100 IR Reflectometer** and in accordance with the ASTM E408 standard.

The table below lists specifications for the TEMP 2000A.

Wavelength <3um to >35um (not limited by filters, windows, etc.)
Measurement accuracy (for specular and diffuse samples) – ± 1% of full scale for gray samples
– ± 3% of full scale for non-gray samples
Repeatability – ± 0.5% of full scale or better
Sample type Any Sample, including foils, insulators, etc.
Sample size and geometry Flat Surfaces: ≥ 0.4 inches (1 cm) diameter
Concave Surfaces: ≥ 6.5 inches (16.5 cm) diameter
Convex Surfaces:  1 inch (2.5 cm) diameter
Sample temperature Room Temperature, Ambient
Displayed properties Infrared Reflectance
Normal Emittance (300K)
Hemispherical Emittance (300K)
Readouts -Digital LCD panel meter
-Selectable IR emittance or reflectance display
Measurement range (reflectance) 0.00 to 1.00
Dimensions -Optical Head: 5.25″ diameter x 6.8″ long
-Control and Display Unit: 4.5 x 7.75 x 7 inches
-Carry Case: 12.5 x 17 x 11 inches
Warranty 1 year parts and labor

*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably.
**TEMP 2000A represents an excellent cost-effective option for replacing a Gier Dunkle DB100 while increasing portability(Alternative to SOC, 410, 400T, directional reflectometer, ET100, ET10, Surface Optics, Portable emmisometer.